The Materials Characterisation and Fabrication Platform (MCFP) supports materials research through advanced instrumentation, analysis and characterisation. The MCFP welcomes all users across the scientific community, from universities and research institutes to industry.
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Mass cytometry
Uniquely combining time-of-flight mass spectrometry and metal-labelling technology, mass cytometry allows single cell resolution within complex biological systems.
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Super-resolution microscopy
High-speed deconvolution microscopy, live-cell imaging, stochastic illumination.
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Atomic force microscopy
The MCFP hosts four Atomic Force Microscopes. These are available to carry out a wide range of imaging and measurements.
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X-ray diffraction and residual stress
X-ray diffraction provides information on the structure of your material.
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Multi-ion beam microscopy and nanofabrication
The Zeiss Orion NanoFab is an advanced scanning microscope that utilises an interchangeable multi-ion beam (helium and neon) for nanofabrication and sub-nanometre imaging.
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Particle characterisation
The MCFP hosts a number of complimentary techniques for particle characterisation including the recently installed NanoSight NS300.
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Nanofabrication
The MCFP Nanofabrication platform supports University of Melbourne (UoM) researchers accessing the Melbourne Centre for Nanofabrication (MCN) located in Clayton.
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Confocal and deconvolution microscopy
A versatile range of confocal and deconvolution microscopy is available for access.
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Flow cytometry
Flow cytometer, with extreme sensitivity and resolution, is suitable for a wide range of experiments.
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Nanoindentation
Nano-indentation, micro-indentation, scratch testing, impact testing, liquid cell, nanopositioner stage for imaging of samples.
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Contact angle and surface tensiometry
Contact angle measuring device for the measurement of the static and the dynamic contact angle, the surface free energy of solids, and the surface and the interfacial tension of liquids.
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Mechanical testing
Mechanical Testing provides information on the mechanical properties of you material
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Scanning Electron Microscopy
SEM